Physical measurement and analysis of thin films/ 
edited by E. M. Murt and W. G. Guldner. 
 - New York:  Plenum Press,  1969. 
 - xi, 194 p. :   ill. ;   24 cm. 
<br/><br/>Includes bibliographies. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Thin films.