TY  - BOOK
AU  - Siegel,Benjamin M.
AU  - Beaman,Donald Robert
ED  - Electron Microscopy Society of America.
ED  - Microbeam Analysis Society.
TI  - Physical aspects of electron microscopy and microbeam analysis
SN  - 0471790206
PY  - 1975///
CY  - New York
PB  - Wiley
KW  - Electron microscopes
KW  - Microprobe analysis
KW  - Microchemistry
N1  - Expanded versions of papers presented at the joint meetings of the Electron Microscopy Society of America and the Microbeam Analysis Society, held in New Orleans, Aug. 14-17, 1973; 'A Wiley biomedical-health publication.'; Includes bibliographical references and index
ER  -