Physical aspects of electron microscopy and microbeam analysis / 
edited by Benjamin M. Siegel, and Donald R. Beaman. 
 - New York :  Wiley,  1975 
 - xiii, 474 pages. :  illustrations. ;  26 cm. 
<br/><br/> Expanded versions of papers presented at the joint meetings of the Electron Microscopy Society of America and the Microbeam Analysis Society, held in New Orleans, Aug. 14-17, 1973.  'A Wiley biomedical-health publication.' 
<br/><br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>0471790206 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electron microscopes.<br/>Microprobe analysis.<br/>Microchemistry.