TY  - BOOK
AU  - Chakradhar,Srimat T.
AU  - Agrawal,Vishwani D.
AU  - Bushnell,Michael L.
TI  - Neural models and algorithms for digital testing
SN  - 0792391659
PY  - 1991///
CY  - Boston
PB  - Kluwer Academic Publishers
KW  - Logic circuits
KW  - Testing
KW  - Automatic checkout equipment
KW  - Digital integrated circuits
KW  - Data processing
ER  -