Chakradhar, Srimat T. <br/><br/>
Neural models and algorithms for digital testing / 
by Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushnell. 
 - Boston :  Kluwer Academic Publishers,  1991. 
 - 184 p. :  ill. ;  24 cm. 
<br/><br/><label>ISBN: </label>0792391659  RM190.61 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Logic circuits--Testing.<br/>Automatic checkout equipment.<br/>Digital integrated circuits--Testing--Data processing.