Metallographic specimen preparation :  optical and electron microscopy / 
edited by James L. McCall and William M. Mueller 
 - New York :  Plenum Press,  1974 
 - 358 p. :  ill. ;  26 cm. 
<br/><br/> Proceedings of a conference sponsored by the International Metallographic Society and the American Society for Metals and held in Beverly Hills, Calif., Sept. 23-24, 1973 
<br/><br/>Includes bibliographical references 
<br/><br/><label>ISBN: </label>030630791X 
<br/><br/><label>LCCN: </label>74-8391 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Metallographic specimens--Congresses<br/>Electron metallography--Congresses