Knowledge based systems for test and diagnosis :  proceedings... / 
edited by G. Saucier, A. Ambler, M. A. Breuer. 
 - Amsterdam :  North-Holland,  1989. 
 - 257 p. :  ill. ;  23 cm. 
<br/><br/><label>ISBN: </label>0444881131 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Expert systems (Computer science)--Congresses.<br/>Testing--Data processing--Congresses.