Sandow, Peter Micheal,  1947- <br/><br/>
An investigation of deep levels in silicon  [microform] / 
by Peter Micheal Sandow. 
 - Ann Arbor, Mich. :  University Microfilms International ,  1978. 
 - 2 microfiches ;  11 x 15 cm. 
<br/><br/>Thesis (Ph.D.) - Pennsylvania State University, 1977. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductors--Silicon.