Introduction to scanning transmission electron microscopy / 
by Robert J. Keyse ... et al. 
 - Singapore :  Springer-Verlag,  1998. 
 - 114 p. :  ill. ;  24 cm. 
<br/><br/><label>ISBN: </label>9813083433  RM121.54 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Microscopy electron.<br/>Scanning.