Fundamentals of surface and thin film analysis / by Leonard G. Feldman and James W. Mayer
Publication details: New York : North-Holland, 1986Description: 352 p. : ill. ; c23 cmISBN:- 6044400982
| Item type | Current library | Home library | Collection | Call number | Materials specified | Copy number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|---|---|---|
| AM | PERPUSTAKAAN TUN SERI LANANG | PERPUSTAKAAN TUN SERI LANANG KOLEKSI AM-P. TUN SERI LANANG (ARAS 5) | - | QD506.F39 (Browse shelf(Opens below)) | 1 | Available | 00000287952 |
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