Characterization in compound semiconductor processing / editors, Yale Strausser and Gary E. McGuire.
Series: Materials characterization series | Materials characterization seriesPublication details: New York: Momentum Press , 2010.Description: xvi, 199 p. : ill. ; 25 cmISBN:- 9781606500415
- Compound semiconductor processing
| Item type | Current library | Home library | Collection | Call number | Materials specified | Copy number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|---|---|---|
| AM | PERPUSTAKAAN TUN SERI LANANG | PERPUSTAKAAN TUN SERI LANANG KOLEKSI AM-P. TUN SERI LANANG (ARAS 5) | - | QC611.8.C64C484 (Browse shelf(Opens below)) | 1 | Available | 00002050833 |
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'First published by Butterworth-Heinemann in 1995'.
Includes bibliographical references and index.
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