Image from Amazon.com
Amplitude modulation atomic force microscopy / by Ricardo Garc.
Publication details: Weinheim : Wiley-VCH, 2010.Description: xiv, 179 p. : ill. ; 25 cmISBN:- 9783527408344
- 3527408347
| Item type | Current library | Home library | Collection | Call number | Materials specified | Copy number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|---|---|---|
| AM | PERPUSTAKAAN DR ABDUL LATIFF | PERPUSTAKAAN DR ABDUL LATIFF KOLEKSI AM-P. DR ABDUL LATIFF | - | QH212.A78 C378 3 (Browse shelf(Opens below)) | 1 | Available | 00002016749 | |||
| AM | PERPUSTAKAAN LINGKUNGAN KEDUA | PERPUSTAKAAN LINGKUNGAN KEDUA KOLEKSI AM-P. LINGKUNGAN KEDUA | - | QH212.A78 C378 3 (Browse shelf(Opens below)) | 1 | Available | 00002034625 |
Browsing PERPUSTAKAAN LINGKUNGAN KEDUA shelves, Shelving location: KOLEKSI AM-P. LINGKUNGAN KEDUA Close shelf browser (Hides shelf browser)
|
|
|
|
|
No cover image available |
|
||
| QE599.2.L358 3 Landslides : types, mechanisms and modeling / | QH104.L956 2011 3 Practical handbook for wetland identification and delineation / | QH104.M57 2015 3 Wetlands / | QH212.A78 C378 3 Amplitude modulation atomic force microscopy / | QH212.A78A867 3 Atomic force microscopy in process engineering : introduction to AFM for improved processes and products / | QH212.A78N364 3 Noncontact atomic force microscopy / | QH212.E4 I4155 3 In-situ electron microscopy at high resolution / |
Includes bibliographical references (p. 139-173) and index.
There are no comments on this title.
Log in to your account to post a comment.