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Atomic force microscopy in process engineering : introduction to AFM for improved processes and products / [edited by] W. Richard Bowen and Nidal Hilal
Publication details: Oxford : Butterworth-Heinemann, 2009Description: xvi, 283 p. : ill. ; 24 cmISBN:- 9781856175173 (hbk.) :
| Item type | Current library | Home library | Collection | Call number | Materials specified | Copy number | Status | Date due | Barcode | |
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| AM | PERPUSTAKAAN LINGKUNGAN KEDUA | PERPUSTAKAAN LINGKUNGAN KEDUA KOLEKSI AM-P. LINGKUNGAN KEDUA | - | QH212.A78A867 3 (Browse shelf(Opens below)) | 1 | Available | 00002023969 |
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| QH104.L956 2011 3 Practical handbook for wetland identification and delineation / | QH104.M57 2015 3 Wetlands / | QH212.A78 C378 3 Amplitude modulation atomic force microscopy / | QH212.A78A867 3 Atomic force microscopy in process engineering : introduction to AFM for improved processes and products / | QH212.A78N364 3 Noncontact atomic force microscopy / | QH212.E4 I4155 3 In-situ electron microscopy at high resolution / | QH212.N43N365 3 Nano-optics and near-field optical microscopy / |
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