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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching [electronic resource] : Application to Rough and Natural Surfaces / by Gerd Kaupp.

By: Contributor(s): Publication details: Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg, 2006.Description: xii, 292 p. : ill., digital ; 24 cmISBN:
  • 9783540284727 (electronic bk.)
Subject(s): DDC classification:
  • 502.82 22
LOC classification:
  • QH212.A78 K38 2006
Online resources: In: Springer e-books
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