X-ray characterization of materials / Eric Lifshin (ed.)

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Publication details: Weinheim : Wiley-VCH, 1999Description: xvi, 261 p. : ill. ; 25 cmISBN:

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Item type	Current library	Home library	Collection	Call number	Materials specified	Copy number	Status	Date due	Barcode
AM	PERPUSTAKAAN LINGKUNGAN KEDUA	PERPUSTAKAAN LINGKUNGAN KEDUA KOLEKSI AM-P. LINGKUNGAN KEDUA	-	TA417.215.X729 3 (Browse shelf(Opens below))		1	Available		00001294767

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Previous	TA417.2.T73 1991 Training guidelines in non-destructive testing techniques	TA417.2.W67 1989 j.1 Non-destructive testing : proceeding of the 12th World Conference on Non-Desructive Testing, Amsterdam, The Netherlands, April 23-28, 1989 /	TA417.2.W67 1989 j.2 Non-destructive testing : proceeding of the 12th World Conference on Non-Desructive Testing, Amsterdam, The Netherlands, April 23-28, 1989 /	TA417.215.X729 3 X-ray characterization of materials /	TA417.23.A645 The application of electron microscopy to materials science proceedings of an International Workshop, held in China, Gauonzhou, August 1988	TA417.23.A66 Applications of electron microscopy in the earth sciences a short course sponsored by the Mineralogical Association of Canada and held immediately prior to the 1985 annual meeting, at the University of New Brunswick, Frederiction, New Brunswick, May 13th	TA417.23.B734 2008 Microstructural characterization of materials /	Next

Includes bibliographical references and index.

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