X-ray microanalysis in the electron microscope John A. Chandler
Series: Practical methods in electron microscopy ; v.5, pt.2Publication details: Amsterdam North-Holland Publishing Co. 1977Description: p.317-547 ill. 23cmISBN:- 0720406072
| Item type | Current library | Home library | Collection | Call number | Materials specified | Copy number | Status | Date due | Barcode | |
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| AM | PERPUSTAKAAN TUN SERI LANANG | PERPUSTAKAAN TUN SERI LANANG KOLEKSI AM-P. TUN SERI LANANG (ARAS 5) | - | QH212.E4C45 (Browse shelf(Opens below)) | 1 | Available | 00000157122 | |||
| AM | PERPUSTAKAAN TUN SERI LANANG | PERPUSTAKAAN TUN SERI LANANG KOLEKSI AM-P. TUN SERI LANANG (ARAS 5) | - | QH212.E4C45 n.2 (Browse shelf(Opens below)) | 1 | Available | 00000292062 |
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| QH212.E4A85 1992 Electron microscopy 5th Asia-Pacific electron microscopy conference, Beijing, China, 2-6 August 1992 / | QH212.E4B417 The beginnings of electron microscopy / | QH212.E4C45 X-ray microanalysis in the electron microscope | QH212.E4C45 n.2 X-ray microanalysis in the electron microscope | QH212.E4C47 Understanding and optimising electron microscope performance | QH212.E4C63 Computer processing of electron microscope images | QH212.E4C63 Computer processing of electron microscope images |
Includes bibliographies
2
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