Statistical analysis of reliability and life-testing models : theory and methods / Lee J. Bain.

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Series: Statistics, textbooks and monographs ; v. 11 ;Publication details: New York : M. Dekker ; 1978.Description: xii, 450 pages ; 24 cmISBN:

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Holdings
Item type	Current library	Home library	Collection	Call number	Materials specified	Copy number	Status	Date due	Barcode
AM	PERPUSTAKAAN LINGKUNGAN KEDUA	PERPUSTAKAAN LINGKUNGAN KEDUA KOLEKSI AM-P. LINGKUNGAN KEDUA	-	TS173.B34 (Browse shelf(Opens below))		1	Available		00000041434

Includes index

Bibliography: p. 429-438

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