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Reliability and degradation semiconductor devices and circuits/ edited by M.J.Howes, D.V.Morgan.
Series: The Wiley series in solid state devices and circuitsPublication details: Chichester: John Wiley & Sons, 1981.Description: 444p.; 23 cmISBN:- 0471280283
| Item type | Current library | Home library | Collection | Call number | Materials specified | Copy number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|---|---|---|
| AM | PERPUSTAKAAN LINGKUNGAN KEDUA | PERPUSTAKAAN LINGKUNGAN KEDUA KOLEKSI AM-P. LINGKUNGAN KEDUA | - | TK7871.85.R44 (Browse shelf(Opens below)) | 1 | Available | 00000314777 | |||
| AM | PERPUSTAKAAN TUN SERI LANANG | PERPUSTAKAAN TUN SERI LANANG KOLEKSI AM-P. TUN SERI LANANG (ARAS 5) | - | TK7871.85.R44 (Browse shelf(Opens below)) | 1 | Available | 00000147636 |
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| TK7871.85.P544 2003 3 Advanced semiconductor fundamentals / | TK7871.85.P73 3 Predictive simulation of semiconductor processing : status and challenges / | TK7871.85.P84 Introduction to microelectronic devices / | TK7871.85.R44 Reliability and degradation semiconductor devices and circuits/ | TK7871.85.R52 1997 Spice | TK7871.85.R526 3 High-speed heterostructure devices : from device concepts to circuit modeling / | TK7871.85.R529 3 The materials science of semiconductors / |
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