Hazard assessment and control technology in semiconductor manufacturing II. (Record no. 95235)

MARC details
000 -LEADER
fixed length control field 01232nam a2200313 a 4500
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20250913131134.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 981208s1993 xxu 00 eng b
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 188241702X
Terms of availability RM90.08
039 #9 - LEVEL OF BIBLIOGRAPHIC CONTROL AND CODING DETAIL [OBSOLETE]
Level of rules in bibliographic description 201203061211
Level of effort used to assign nonsubject heading access points jamil
Level of effort used to assign subject headings 201203061210
Level of effort used to assign classification jamil
Level of effort used to assign subject headings 201203061210
Level of effort used to assign classification jamil
y 08-18-1999
z load
040 ## - CATALOGING SOURCE
Original cataloging agency UKM
060 ## - NATIONAL LIBRARY OF MEDICINE CALL NUMBER
Classification number WA400
Item number .H428 1993
090 ## - LOCALLY ASSIGNED LC-TYPE CALL NUMBER (OCLC); LOCAL CALL NUMBER (RLIN)
Classification number (OCLC) (R) ; Classification number, CALL (RLIN) (NR) WA400.H428 1993 9
245 00 - TITLE STATEMENT
Title Hazard assessment and control technology in semiconductor manufacturing II.
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. Cincinnati, Ohio :
Name of publisher, distributor, etc. American Conference of Governmental Industrial Hygienists,
Date of publication, distribution, etc. 1993
300 ## - PHYSICAL DESCRIPTION
Extent 347 p. :
Other physical details ill. ;
Dimensions 24 cm.
590 ## - LOCAL NOTE (RLIN)
Local note 1
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Occupational health
Geographic subdivision United States
Form subdivision Congresses.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Safety management
Geographic subdivision United States
Form subdivision Congresses.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Semiconductor industry
Geographic subdivision United States
Form subdivision Congresses.
711 2# - ADDED ENTRY--MEETING NAME
Meeting name or jurisdiction name as entry element National Conference on Hazard Assessment and Control Technology in Semiconductor Manufacturing (2nd : 1991 : Westboro, Massachusetts)
907 ## - LOCAL DATA ELEMENT G, LDG (RLIN)
a .b10934029
b 2019-11-12
c 2019-11-12
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type AM
Suppress in OPAC No
Call number prefix WA400.H428 1993 9
914 ## - VTLS Number
VTLS Number vtls000097065
990 ## - EQUIVALENCES OR CROSS-REFERENCES [LOCAL, CANADA]
Link information for 9XX fields HZ
991 ## - LOCAL NOTE (NAMA FAKULTI/INSTITUT/PUSAT)
a Fakulti Perubatan
998 ## - LOCAL CONTROL INFORMATION (RLIN)
Library PERPUSTAKAAN DR ABDUL LATIFF
Operator's initials, OID (RLIN) 1999-05-08
Cataloger's initials, CIN (RLIN) m
Material Type (Sierra) Printed Books
Language English
Country
-- 0
-- .b10934029
Holdings
Withdrawn status Lost status Damaged status Not for loan Collection Home library Current library Shelving location Date acquired Source of acquisition Cost, normal purchase price Inventory number Total checkouts Full call number Barcode Date last seen Copy number Price effective from Koha item type
          PERPUSTAKAAN DR ABDUL LATIFF PERPUSTAKAAN DR ABDUL LATIFF KOLEKSI AM-P. DR ABDUL LATIFF 12/11/2019 - 0.00 .i12158616   WA400.H428 1993 9 00000750627 13/09/2025 1 13/09/2025 AM

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