MARC details
| 000 -LEADER |
|---|
| fixed length control field |
01168nam a2200289 a 4500 |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
|---|
| control field |
20250913115939.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
981208s1994 xxk 00 0 eng |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
0750302941 |
| Terms of availability |
RM392.81 |
| 039 #9 - LEVEL OF BIBLIOGRAPHIC CONTROL AND CODING DETAIL [OBSOLETE] |
|---|
| Level of rules in bibliographic description |
200806191604 |
| Level of effort used to assign nonsubject heading access points |
zarina |
| y |
08-18-1999 |
| z |
load |
| 040 ## - CATALOGING SOURCE |
|---|
| Original cataloging agency |
UKM |
| 090 ## - LOCALLY ASSIGNED LC-TYPE CALL NUMBER (OCLC); LOCAL CALL NUMBER (RLIN) |
|---|
| Classification number (OCLC) (R) ; Classification number, CALL (RLIN) (NR) |
TK7871.85.D454 |
| 090 ## - LOCALLY ASSIGNED LC-TYPE CALL NUMBER (OCLC); LOCAL CALL NUMBER (RLIN) |
|---|
| Classification number (OCLC) (R) ; Classification number, CALL (RLIN) (NR) |
TK7871.85 |
| Local cutter number (OCLC) ; Book number/undivided call number, CALL (RLIN) |
.D454 |
| 245 10 - TITLE STATEMENT |
|---|
| Title |
Defect recognition and image processing in semiconductors and devices : |
| Remainder of title |
proceedings of the Fifth International Conference, 6-10 September 1993 / |
| Statement of responsibility, etc. |
edited by J. Jimenez |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. |
|---|
| Place of publication, distribution, etc. |
Bristol : |
| Name of publisher, distributor, etc. |
Institute of Physics, |
| Date of publication, distribution, etc. |
1994 |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
xx, 417 p. : |
| Other physical details |
ill. ; |
| Dimensions |
24 cm. |
| 440 #0 - SERIES STATEMENT/ADDED ENTRY--TITLE |
|---|
| Title |
Institute of Physics conference series ; |
| Volume/sequential designation |
135 |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Semiconductors |
| General subdivision |
Defects |
| Form subdivision |
Congresses |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Image processing |
| Form subdivision |
Congresses |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Jimenez, J. |
| 711 2# - ADDED ENTRY--MEETING NAME |
|---|
| Meeting name or jurisdiction name as entry element |
International Symposium on Defect Recognition and Image Processing in III-V Compounds |
| Number of part/section/meeting |
(5th : 1993 : Santander, Spain) |
| 907 ## - LOCAL DATA ELEMENT G, LDG (RLIN) |
|---|
| a |
.b10515264 |
| b |
2021-05-28 |
| c |
2019-11-12 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
|---|
| Koha item type |
AM |
| Suppress in OPAC |
No |
| Call number prefix |
TK7871.85.D454 |
| 914 ## - VTLS Number |
|---|
| VTLS Number |
vtls000053643 |
| 991 ## - LOCAL NOTE (NAMA FAKULTI/INSTITUT/PUSAT) |
|---|
| a |
Fakulti Sains Fizik dan Gunaan |
| 998 ## - LOCAL CONTROL INFORMATION (RLIN) |
|---|
| Library |
PERPUSTAKAAN LINGKUNGAN KEDUA |
| Operator's initials, OID (RLIN) |
1999-05-08 |
| Cataloger's initials, CIN (RLIN) |
m |
| Material Type (Sierra) |
Printed Books |
| Language |
English |
| Country |
|
| -- |
0 |
| -- |
.b10515264 |
