Imperfections and impurities in semiconductor silicon / (Record no. 104992)

MARC details
000 -LEADER
fixed length control field 00967nam a2200289 a 4500
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20250913132932.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 981208s1981 xxu 00 eng
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 0471078174
039 #9 - LEVEL OF BIBLIOGRAPHIC CONTROL AND CODING DETAIL [OBSOLETE]
Level of rules in bibliographic description 201303071527
Level of effort used to assign nonsubject heading access points norsiah
y 08-18-1999
z load
040 ## - CATALOGING SOURCE
Original cataloging agency UKM
090 ## - LOCALLY ASSIGNED LC-TYPE CALL NUMBER (OCLC); LOCAL CALL NUMBER (RLIN)
Classification number (OCLC) (R) ; Classification number, CALL (RLIN) (NR) QC611.8.S5
Local cutter number (OCLC) ; Book number/undivided call number, CALL (RLIN) R38
090 ## - LOCALLY ASSIGNED LC-TYPE CALL NUMBER (OCLC); LOCAL CALL NUMBER (RLIN)
Classification number (OCLC) (R) ; Classification number, CALL (RLIN) (NR) QC611.8.S5
Local cutter number (OCLC) ; Book number/undivided call number, CALL (RLIN) R38
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Ravi, K. V., 1940-,
Relator term author.
245 10 - TITLE STATEMENT
Title Imperfections and impurities in semiconductor silicon /
Statement of responsibility, etc. K.V. Ravi.
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. New York ;
Name of publisher, distributor, etc. Wiley,
Date of publication, distribution, etc. 1981.
300 ## - PHYSICAL DESCRIPTION
Extent 379 pages :
Other physical details illustrations ;
Dimensions 24 cm.
500 ## - GENERAL NOTE
General note 'A Wiley-Interscience publication'
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc. note Includes bibliographical references
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Silicon
General subdivision Defects.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Semiconductors
General subdivision Defects.
907 ## - LOCAL DATA ELEMENT G, LDG (RLIN)
a .b11031700
b 2021-05-28
c 2019-11-12
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type AM
Suppress in OPAC No
Call number prefix QC611.8.S5 R38
914 ## - VTLS Number
VTLS Number vtls000107143
949 ## - LOCAL PROCESSING INFORMATION (OCLC)
o 600006786
991 ## - LOCAL NOTE (NAMA FAKULTI/INSTITUT/PUSAT)
a Fakulti Sains Fizik dan Gunaan
998 ## - LOCAL CONTROL INFORMATION (RLIN)
Library PERPUSTAKAAN TUN SERI LANANG
Operator's initials, OID (RLIN) 1999-05-08
Cataloger's initials, CIN (RLIN) m
Material Type (Sierra) Printed Books
Language English
Country
-- 0
-- .b11031700
Holdings
Withdrawn status Lost status Damaged status Not for loan Collection Home library Current library Shelving location Date acquired Source of acquisition Cost, normal purchase price Inventory number Total checkouts Full call number Barcode Date last seen Copy number Price effective from Koha item type Materials specified (bound volume or other part)
          PERPUSTAKAAN TUN SERI LANANG PERPUSTAKAAN TUN SERI LANANG KOLEKSI AM-P. TUN SERI LANANG (ARAS 5) 12/11/2019 - 0.00 .i12357613 7 QC611.8.S5 R38 00000061784 13/09/2025 1 13/09/2025 AM  
      Discard   PERPUSTAKAAN TUN SERI LANANG PERPUSTAKAAN TUN SERI LANANG KOLEKSI AM-P. TUN SERI LANANG (ARAS 5) 12/11/2019 - 0.00 .i12357625   QC611.8.S5R38 3 00000280384 13/09/2025 1 13/09/2025 AM  
          PERPUSTAKAAN TUN SERI LANANG PERPUSTAKAAN TUN SERI LANANG KOLEKSI AM-P. TUN SERI LANANG (ARAS 5) 10/01/2020 - 0.00 .i21293119   QC611.8.S5R38 00000959748 13/09/2025 1 13/09/2025 AM n.2

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