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Characterization in compound semiconductor processing /

Characterization in compound semiconductor processing / Compound semiconductor processing. editors, Yale Strausser and Gary E. McGuire. - New York: Momentum Press , 2010. - xvi, 199 p. : ill. ; 25 cm - Materials characterization series. . - Materials characterization series. .

'First published by Butterworth-Heinemann in 1995'.

Includes bibliographical references and index.

ISBN: 9781606500415 RM233.94

Subjects--Topical Terms:
Compound semiconductors.
Compound semiconductors--Surfaces.

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