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Testable structures for CMOS VLSI circuits (microform) /

Liu, Dick Li-Ta

Testable structures for CMOS VLSI circuits (microform) / Liu Dick Li-Ta - Ann Arbor, Mich. : University Microfilms International, 1987 - 2 microfiches ; 11 x 15 cm.

Thesis (Ph.D.)-Stanford University, 1987

Subjects--Topical Terms:
Integrated circuits--Very large scale integration--Testing

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Testable structures for CMOS VLSI circuits (microform) /

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