Testability analysis and test generation for sequential VLSI circuits (microform) /
Hudli, Raghu Vishwanath
Testability analysis and test generation for sequential VLSI circuits (microform) / Raghu Vishwanath Hudli - Ann Arbor, Mich. : University Microfilms International, 1990 - 2 microfiches ; 11 x 15 cm.
Thesis (Ph.D.)-University of Nebraska-Lincoln, 1990
Integrated circuits--Very large scale integration--Testing
Testability analysis and test generation for sequential VLSI circuits (microform) / Raghu Vishwanath Hudli - Ann Arbor, Mich. : University Microfilms International, 1990 - 2 microfiches ; 11 x 15 cm.
Thesis (Ph.D.)-University of Nebraska-Lincoln, 1990
Integrated circuits--Very large scale integration--Testing