Normal view MARC view ISBD view

Semiconductor devices: testing and evaluation /

Jowett, C. E. (Charles Eric).

Semiconductor devices: testing and evaluation / by C. E. Jowett. - London: Business Books. 1974. - vii, 134 p. : ill. ; 24 cm.

Includes index.

Bibliography: p. 125-126.

ISBN: 0220662215

Subjects--Topical Terms:
Semiconductors--Testing

Place hold
Print
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)

Semiconductor devices: testing and evaluation /

Contact Us

Copyright ©The National University of Malaysia Library