Metallographic specimen preparation : optical and electron microscopy /

Metallographic specimen preparation : optical and electron microscopy / edited by James L. McCall and William M. Mueller - New York : Plenum Press, 1974 - 358 p. : ill. ; 26 cm.

Proceedings of a conference sponsored by the International Metallographic Society and the American Society for Metals and held in Beverly Hills, Calif., Sept. 23-24, 1973

Includes bibliographical references

030630791X

74-8391


Metallographic specimens--Congresses
Electron metallography--Congresses

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